The ability to synthesis well-ordered two-dimensional materials under ultra-high vacuum and directly characterize them by other techniques in-situ can greatly advance our current understanding on their physical and chemical properties. In this paper, we demonstrate that iso-oriented a-MoO3 films with as low as single monolayer thickness can be reproducibly grown on SrTiO3(001) substrates by molecular beam epitaxy ( (010)MoO3 || (001)STO, [100]MoO3 || [100]STO or [010]STO) through a self-limiting process. While one in-plane lattice parameter of the MoO3 is very close to that of the SrTiO3 (aMoO3 = 3.96 Å, aSTO = 3.905 Å), the lattice mismatch along other direction is large (~5%, cMoO3 = 3.70 Å), which leads to relaxation as clearly observed from the splitting of streaks in reflection high-energy electron diffraction (RHEED) patterns. A narrow range in the growth temperature is found to be optimal for the growth of monolayer a-MoO3 films. Increasing deposition time will not lead to further increase in thickness, which is explained by a balance between deposition and thermal desorption due to the weak van der Waals force between a-MoO3 layers. Lowering growth temperature after the initial iso-oriented a-MoO3 monolayer leads to thicker a-MoO3(010) films with excellent crystallinity.
Revised: April 14, 2020 |
Published: February 7, 2016
Citation
Du Y., G. Li, E.W. Peterson, J. Zhou, X. Zhang, R. Mu, and Z. Dohnalek, et al. 2016.Iso-oriented monolayer a-MoO3(010) films epitaxially grown on SrTiO3(001).Nanoscale 8, no. 5:3119-3124.PNNL-SA-114428.doi:10.1039/C5NR07745A