Tip-enhanced Raman scattering (TERS) can be used to image plasmon-enhanced local electric field variations with extremely high spatial resolution under ambient conditions. This is illustrated through TERS images recorded using a silver atomic force microscope tip coated with strategically selected molecular reporters and used to image a sputtered silver film.
Revised: September 11, 2017 |
Published: July 7, 2017
Citation
Bhattarai A., and P.Z. El-Khoury. 2017.Imaging Localized Electric Fields with Nanometer Precision through Tip-Enhanced Raman Scattering.Chemical Communications 53, no. 53:7310-7313.PNNL-SA-125604.doi:10.1039/c7cc02593a