May 1, 2020
Journal Article

Guide to Making XPS Measurements on Nanoparticles

Abstract

This guide briefly summarizes issues and considerations important for the use of X-ray Photoelectron Spectroscopy (XPS) for characterizing nanoparticles, which are important in many areas of science and technology. Because the surfaces play a major role in determining nanoparticle behaviors, XPS is an increasingly useful tool for understanding their properties, including addressing variations and non-reproducibility issues associated with these materials. The unusual physical and chemical behaviors of these particles must be considered in preparing and characterizing these materials. This guide is one of a series intended to highlight best practices in the use of XPS.

Revised: March 26, 2020 | Published: May 1, 2020

Citation

Baer D.R. 2020. Guide to Making XPS Measurements on Nanoparticles. Journal of Vacuum Science & Technology A: International Journal Devoted to Vacuum, Surfaces, and Films 38, no. 3:Article No. 031201. PNNL-SA-149921. doi:10.1116/1.5141419