Growth and Characterization of Single-Crystal Multilayer Nanostructures for Fast Ion Conduction

January 15, 2005

Conference Paper

Growth and Characterization of Single-Crystal Multilayer Nanostructures for Fast Ion Conduction

Abstract

Single-crystal multi-layered thin films of pure and mixed ceria and zirconia were heteroepitaxially grown using molecular beam epitaxy on yttria stabilized zirconia substrates. The growth of these films was monitored using in-situ reflection high-energy electron diffraction (RHEED). In addition, the ex-situ characterization techniques including X-ray diffraction (XRD), high-resolution transmission electron microscopy (HRTEM) and Rutherford backscattering spectrometry (RBS) along with ion channeling were used to further characterize these films.

Revised: November 27, 2018 | Published: January 15, 2005

Citation

Azad S., S. Thevuthasan, V. Shutthanandan, C.M. Wang, D.E. Mccready, L.V. Saraf, and O.A. Marina, et al. 2005. Growth and Characterization of Single-Crystal Multilayer Nanostructures for Fast Ion Conduction. In Nanotechnology and the Environmental: Applications and Implications. ACS Symposium Series 890, edited by B Karn, et al, 133-141. Washington, Dc:American Chemical Society. PNNL-SA-38440.