In the special section of this issue of Surface and Interface Analysis, 3 groups present their breaking research in pushing the boundaries of vacuum-based techniques such as XPS and SIMS to near ambient pressures. We have invited the leading authors to describe the impact of their research and share their perspective.
Revised: August 14, 2019 |
Published: October 1, 2018
Citation
Artyushkova K., D.R. Mullins, L. Gregoratti, and X. Yu. 2018.Foreword to special section on “Near Ambient and Synchrotron Surface Analysis (NAXPS)".Surface and Interface Analysis 50, no. 10:911-912.PNNL-SA-135364.doi:10.1002/sia.6383