August 15, 2011
Journal Article

Electron Backscatter Diffraction Analysis of a CZT Growth Tip from a Vertical Gradient Freeze Furnace

Abstract

Electronic backscatter diffraction (EBSD) was used to characterize the growth-tip region of a 4.2-cm diameter CdZnTe (CZT) boule grown using low-pressure Bridgman method in a vertical gradient freeze furnace. The boule was sectioned and polished and a section taken along the boule longitudinal centerline with an approximate surface area of 1-cm2 was used for optical and scanning electron microscopy. A collage was assembled using EBSD/SEM images to show morphological features, e.g., twin structure, grain structure, and overall crystal growth direction. Severely twinned regions originating from the tip and side walls were observed. The overall growth orientation was close to and directions. In some regions, the (001) poles of the CZT matrix aligned with the growth direction, while twins aligned such that (111) and (112) poles aligned with the growth direction. In some other areas, (112) or (011) poles of the CZT matrix aligned with the growth direction. New relationships between the CZT matrix and large Te polycrystalline particles were revealed: {11 }CZT??{1 00}Te and {001}CZT??{0 1}Te.

Revised: September 14, 2011 | Published: August 15, 2011

Citation

Sundaram S.K., C.H. Henager, D.J. Edwards, A.L. Schemer-Kohrn, M. Bliss, and B.J. Riley. 2011. Electron Backscatter Diffraction Analysis of a CZT Growth Tip from a Vertical Gradient Freeze Furnace. Journal of Crystal Growth 329, no. 1:12-19. PNNL-SA-73552. doi:10.1016/j.jcrysgro.2011.02.008