A novel device has been fabricated for the electrodeposition of technetium metal onto platinum filaments for thermal ionization mass spectrometric (TIMS) measurements. The ability of the device to focus the deposition to diameters of hundreds of micrometers on pre-mounted TIMS filaments coupled with the ease of use and simplicity of design permit for an extremely sensitive yet economical TIMS filament loading technique. Electrodeposition parameters were varied in order to maximize deposition efficiency. X-ray photoelectron spectroscopy (XPS) was used to confirm and characterize the technetium deposit. The technetium is deposited in the metallic state, although surface oxides in the 4+ and 7+ state form readily. Initial TIMS measurements of the electrodeposited technetium in the presence of a barium sulfate ionization enhancer show potential for excellent sensitivity.
Revised: September 4, 2008 |
Published: May 15, 2008
Citation
Engelmann M.D., L.A. Metz, J.E. Delmore, M.H. Engelhard, and N.E. Ballou. 2008.Electrodeposition of Technetium on Platinum for Thermal Ionization Mass Spectrometry (TIMS).Journal of Radioanalytical and Nuclear Chemistry 276, no. 2:493-498.PNNL-SA-60837.doi:10.1007/s10967-008-0532-y