PNNL

Abstract

Failure of polarization reversal, i.e., ferroelectric fatigue, in ferroelectric materials has been a long-standing challenge that negatively impacts the application of ferroelectrics in electronic devices where reliability is critical. The mechanisms of ferroelectric fatigue have not been fully understood. In this study, in-situ biasing transmission electron microscopy was used to study the structural responses of ferroelectric domains to in-plane cyclic electric loading. A Pb(Mg1/3Nb2/3)O3-0.38PbTiO3 single crystal was used as the model material. Results show that ferroelectric fatigue can occur via the formation of new domains with out-of-plane polarization from the walls of original domains with in-plane polarization. The polarization direction of the new domains did not reverse under in-plane electric loading. This finding reveals that ferroelectric domain walls play a vital role in the evolution of fatigue in ferroelectric materials.