PNNL

Abstract

PNNL and other SECA CTP participants use a wide range of materials characterization techniques (XRD, SEM, EDS, TEM, XPS, TGA, DSC, PSA, electrical conductivity, single and dual atmosphere oxidation, etc.) and sub-stack multiple component tests (e.g., “button” cell testing, ASR testing of interconnect/cathode/cathode structures, and leak testing of cell/seal/interconnect structures) to evaluate the performance of newly developed materials, fabrication processes, and design concepts. In recent years, PNNL has developed and implemented a “stack” test fixture intended to evaluate/validate cell and stack component performance under realistic stack conditions. It is anticipated that results from these stack fixture tests will help to bridge the gap between typical CTP tests and the full scale cells and stacks under development by the SECA industrial teams, and thus facilitate technology transfer from the CTP to those teams.