PNNL

Abstract

New cryogenic characterization techniques for exploring the nanoscale structure and chemistry of intact solid-liquid interfaces have recently been developed. These techniques provide a high-resolution picture of buried interfaces from large samples or devices that cannot be obtained by other means. The advancement was enabled by the development of instrumentation for cryogenic focused ion beam lift-out, which allows extraction and preparation of intact electron-transparent solid-liquid interfaces from large samples for characterization by cryogenic scanning transmission electron microscopy or atom probe tomography. Future implementation of these techniques will complement current strides in imaging of materials in fluid environments by in-situ liquid phase electron microscopy, providing a more complete understanding of the morphology, surface chemistry, and dynamic processes that occur at solid-liquid interfaces.