Near-field scanning microscopy is a powerful approach to obtain topographic and spectroscopic characterization simultaneously for imaging biological and nanoscale systems. To achieve optical imaging at high spatial resolution beyond the diffraction limit, aperture-less metallic scanning tips have been utilized to enhance the laser illumination local electromagnetic field at the apex of the scanning tips.
Revised: November 10, 2005 |
Published: April 1, 2004
Citation
Hu D., M. Micic, N.A. Klymyshyn, Y.D. Suh, and H.P. Lu. 2004.Correlated Topographic and Spectroscopic Imaging by Combined Atomic Force Microscopy and Optical Microscopy.Journal of Luminescence 107, no. 1-4:4-12.PNNL-SA-39849.