The aim of this study is to characterize precipitates in Mg+ ion implanted and high-temperature annealed cubic silicon carbide using scanning transmission electron microscopy, electron energy loss spectroscopy and atom probe tomography.
Revised: July 25, 2020 |
Published: September 26, 2016
Citation
Jiang W., S.R. Spurgeon, J. Liu, D.J. Edwards, D.K. Schreiber, C.H. Henager, and R.J. Kurtz, et al. 2016.CHARACTERIZATION OF PRECIPITATES IN CUBIC SILICON CARBIDE IMPLANTED WITH 25Mg+ IONS. In In Fusion Materials Semianual Report for the Period Ending 06/30/2016, edited by Daniel Clark. 72-77. DOE/ER-0313/60. Oak Ridge, Tennessee:Oak Ridge National Laboratory.PNNL-SA-120391.