October 25, 2011
Journal Article

Beam Damage of HS (CH2)15 COOH Terminated Self Assembled Monolayer (SAM) as Observed by X-Ray Photoelectron Spectroscopy

Abstract

XPS spectra of HS(CH_2)_15 COOH terminated a self assembled monolayer (SAM)sample was collected over a period of 242 minutes to determine specimen damage during long exposures to monochromatic Al Ka x-rays. For this COOH terminated SAM we measured the loss of oxygen as a function of time by rastering a focused 100 W, 100 um diameter x-ray beam over a 1.4 mm x 0.2 mm area of the sample.

Revised: July 30, 2012 | Published: October 25, 2011

Citation

Engelhard M.H., B.J. Tarasevich, and D.R. Baer. 2011. Beam Damage of HS (CH2)15 COOH Terminated Self Assembled Monolayer (SAM) as Observed by X-Ray Photoelectron Spectroscopy. Surface Science Spectra 18, no. 1:68-81. PNNL-SA-61287. doi:10.1116/11.20080601