September 29, 2009
Journal Article

Atomic Resolution Mapping of the Excited-State Electronic Structure of Cu2O with Time-Resolved X-Ray Absorption Spectroscopy

Abstract

We have used time-resolved soft x-ray spectroscopy to investigate the electronic structure of optically excited cuprous oxide at the O K-edge and the Cu L3-edge. The 400 nm optical excitation shifts the Cu and O absorptions to lower energy, but does not change the integrated x-ray absorption significantly for either edge. The constant integrated x-ray absorption cross-section indicates that that the conduction band and valence band edges have very similar Cu 3d and O 2p orbital contributions. The 2.1 eV optical band gap of Cu2O significantly exceeds the one eV shift in the Cu L3- and O K-edges absorption edges induced by optical excitation, demonstrating the importance of core-hole excitonic effects and valence electron screening in the x-ray absorption process.

Revised: March 16, 2010 | Published: September 29, 2009

Citation

Hillyard P.B., S.N. Kuchibhatla, T.E. Glover, M.P. Hertlein, N. Huse, P. Nachimuthu, and L.V. Saraf, et al. 2009. Atomic Resolution Mapping of the Excited-State Electronic Structure of Cu2O with Time-Resolved X-Ray Absorption Spectroscopy. Physical Review. B, Condensed Matter 80. PNNL-SA-66036. doi:10.1103/PhysRevB.80.125210