Ultra-thin layers of silk deposited on graphene in perfect alignment represent a key advance for the control needed in microelectronics and advanced neural network development.
A breakthrough in electron microscopy based on deep learning can automatically visualize and identify areas of interest, helping to speed advances in materials science.
A new AI model developed at PNNL can identify patterns in electron microscope images of materials without requiring human intervention, allowing for more accurate and consistent materials science.
The convergence of artificial intelligence, cloud, and high-performance computing to accelerate scientific discovery is the focus of a multi-year collaboration between Microsoft and PNNL.