SPARSE SAMPLING METHODS AND PROBE SYSTEMS FOR ANALYTICAL INSTRUMENTS

Patent ID: 9179 | Patent Number 10,431,419 | Status: Granted

Abstract

Sparse sampling approaches and probe systems for analytical instruments are disclosed providing for effective sub-sampling of a specimen and inpainting to reconstruct representations of actual information. The sub-sampling involves serial acquisition of contiguous measured values lying at positions along a scan path extending in a line toward a first direction and having random perturbations in a second direction. The perturbations are limited within a predetermined distance from the line. Inpainting techniques are utilized among the measured values to reconstruct a representation of actual information regarding the specimen.

Application Number

15/643,862

Inventors

Kovarik,Libor
Stevens,Andrew J
Browning,Nigel D
Liyu,Andrey V

Market Sector

Analytical Instruments