Abstract
This invention uses a new scanning mechanism to significantly improve the performance, cost, and ease of integration of the millimeter-wave shoe scanner system. This invention modifies the original scanning arrangement by using rotationally scanned linear arrays. A rotational scanning configuration will allow integration into the floor of cylindrical mm-wave body scanners. The rotational scanning hardware can be reduced in height compared to other arrangements, allowing for integration into existing scanning form factors. A major advantage of this arrangement is that two arrays can be configured with a slight radial offset. When the system performs a full 360-degree scan, the effective sampling locations of the transmit and receive antenna pairs are offset radially. This method allows the sampling density to be effectively interlaced, or doubled, without additional cost or complexity. In addition, this new configuration allows a high-resolution array to be fabricated with a single row of transmit antennas and a single row of receive antennas. This eliminates the difficulty of fabricating an array with more than two rows, which would otherwise be required. This arrangement also allows the signal distribution to be conveniently routed on a printed-circuit board with transmit distribution on one side of the array and receive distribution on the other. This arrangement also allows greater spacing between physical antennas while preserving fine sub-wavelength sampling of the aperture. The rotationally scanned and offset antenna arrays require novel image reconstruction algorithms. This invention uses a novel backprojection method that uses exact antenna positions without requiring the data to be resampled to a uniform grid. Resampling causes substantial errors due to data interpolation inaccuracies. The new reconstruction method also uses a technique referred to as 'aperture weighting" to remove focusing errors caused by non-uniform sampling of the aperture.
Application Number
16/894,484
Inventors
Jones,Mark
Owsley Jr,Stanley L
Sheen,David M
Market Sector
Sensors